Small Methods (2023) 2300453 DOI:10.1002/smtd.202300453
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Small Methods
Measuring spatially-resolved potential drops at semiconductor hetero-interfaces using 4D-STEM
V. Chejarla, S. Ahmed, J. Belz, J. Scheunert, A. Beyer, K. Volz
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Adv. Mater. Interfaces (2023) 2202507 DOI:10.1002/admi.202202507
Bosonic Delocalization of Dipolar Moiré Excitons
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