A5 (Volz)
Beyer et al.,
Nano Lett.

Quantitative Characterization of Nanometer-Scale Electric Fields via Momentum-Resolved STEM

A. Beyer, M.S. Munde, S. Firoozabadi, D. Heimes, T. Grieb, A. Rosenauer, K. Müller-Caspary, K. Volz
Nano Lett. 21 (2021) 2018
DOI:10.1021/acs.nanolett.0c04544

List of all SFB 1083 publications.